Power statistics ccdf, Occupied bandwidth, Spectrum emission mask – Agilent Technologies N9010A User Manual

Page 282

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282

Chapter 32

TD-SCDMA Measurement Application

Measurements

Description

Specification

Supplemental Information

Power Statistics CCDF

Histogram Resolution

0.01 dB

a

a. The Complementary Cumulative Distribution Function (CCDF) is a reformatting of the histogram of

the power envelope. The width of the amplitude bins used by the histogram is the histogram resolution.
The resolution of the CCDF will be the same as the width of those bins.

Description

Specification

Supplemental Information

Occupied Bandwidth

Minimum power at RF Input

−30 dBm (nominal)

Frequency Accuracy

±4.8 kHz

RBW = 30 kHz, Number of Points = 1001,
Span = 4.8 MHz

Description

Specification

Supplemental Information

Spectrum Emission Mask

Dynamic Range, relative

(815 kHz offset

ab

)

74.3 dB

81.3 dB (typical)

Sensitivity, absolute

(815 kHz offset

c

)

−94.7 dBm

−100.7 dBm (typical)

Accuracy

(815 kHz offset)

Relative

d

±0.11 dB

Absolute

e

, 20 to 30

°C

±1.05 dB

±0.31 dB (95th percentile)

a. The dynamic range specification is the ratio of the channel power to the power in the offset specified.

The dynamic range depends on the measurement settings, such as peak power or integrated power.
Dynamic range specifications are based on default measurement settings, with detector set to average,
and depend on the mixer level. Default measurement settings include 30 kHz RBW.

b. This dynamic range specification applies for the optimum mixer level, which is about

−17 dBm. Mixer

level is defined to be the average input power minus the input attenuation.

c. The sensitivity is specified with 0 dB input attenuation. It represents the noise limitations of the ana-

lyzer. It is tested without an input signal. The sensitivity at this offset is specified in the default 30 kHz
RBW, at a center frequency of 2 GHz.

d. The relative accuracy is a measure of the ratio of the power at the offset to the main channel power. It

applies for spectrum emission levels in the offsets that are well above the dynamic range limitation.

e. The absolute accuracy of SEM measurement is the same as the absolute accuracy of the spectrum ana-

lyzer.

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