Pre-test measurements, To run a test – Agilent Technologies EN 61000-3-2 User Manual

Page 32

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4 - Running the Test

32

display. The tabular data displayed in this window provides a permanent record of the test conditions that
existed at the time of the voltage fluctuations test.

ñ The Measured Values area on the right side of the display provide a record of the test conditions

at the time the voltage fluctuations pre-test was run.

ñ The Output Impedance of the Harmonic/ Flicker Test System is automatically set to the

requirements of IEC 1000-3-3 when testing for Voltage fluctuations. For 230 V/50 Hz power
distribution systems, the reference value is 0.4 + j 0.25

(lumped phase and neutral per IEC

725). This corresponds to 796

µ

H for the inductive component.

NOTE:

The output impedance is set to a minimum during the pre-test. This is done to permit
evaluation of ac source performance under the worst-case loading condition possible for
the equipment under test.

Pre-test Measurements

Pre-test measurement data is collected using the following measurement processes:

Measurement

Method

Measurement

Method

Rms voltage

Rms

Power factor

Watts/VA

Frequency

One-shot

Voltage THD

One-shot

Rms current

Rms

Current THD

One-shot

Peak Current

Estimated

Voltage harmonics

Peak

Real power

Average

Current waveform

One-shot

Apparent power

Vrms x Irms

Average, rms, and peak measurements are based on a long-term acquisition process that is
determined by the duration time specified in the Pre-test window. Varying the test duration time
increases the amount of data upon which the measurements are based.

ñ Average measurements are made by acquiring N measurements, totaling the acquired values, and

multiplying by 1/N.

ñ Rms measurements are made by acquiring N measurements, totaling the square of the values,

multiplying by 1/N, and then taking the square root. Vrms and Irms values returned with the pre-
test data are used to calculate Vrms and Irms over integration periods specified by the pre-test
duration control.

ñ Peak method measurements are made by returning the highest value obtained during the

specified integration period.

ñ Voltage THD is calculated by:

(

)

THD

n

Max harmonic

n

to

rms

V

=

=

2

2 40

100

_

*

For voltage harmonics, this is the highest rms value encountered during the pre-test for each
individual voltage harmonic.

ñ The Estimated peak current measurement is implemented by multiplying the integrated Irms

value by the crest factor of the current waveform. Crest factor is calculated by dividing the peak

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