Agilent Technologies EN 61000-3-2 - Manual (Page 91)

Command Summary - C
91
MEASure:ARRay:VOLTage:FLUCtuations:PST?
This query measures voltage fluctuations in accordance with the IEC 868 standard. It is only available
when IEC mode is selected with SYSTem:CONFigure. The parameter specifies the number of Pst
integration periods for which data will be returned in response to the query. This query returns 1 data
structure per specified integration period for a total of <n> structures.
For example: If CALCulate:INTegral:TIME specifies 10 minutes and <n> is set to 12, a 2 hour
measurement is initiated (10 minutes times 12) and 12 structures are returned. Since there are 14 data
points per structure, a total of 168 points are returned. The structure includes flicker perceptibility values
for the component percentiles making up Pst, the Pst value itself, various RMS voltage values (Dmax,
Dc, and Dt), together with indices for these RMS values that give their approximate location in the RMS
time series for the corresponding integration period.
This command is closely related to two similar commands that return different types of data (see
MEAS:ARR:VOLT:FLUC:FLIC and MEAS:ARR:VOLT:FLUC:ALL). Record numbering begins with
one. The figure below defines the structure of the data returned by this query:
P_0.1 ##
P_1s Æ
P_3s Æ
P_10s Æ
P_50s Æ
Pst "#### 12 point Pst array ####
Dmax Ж Ж
Dmax index Ж Ж
Dc Ж Ж
Dc index Ж Ж
Dt Æ "## repeat <n> times
Dt index ##D Ж
Ж
Record Number #########################З
Ж
Error Code #########################D
Command Syntax MEASure:ARRay:VOLTage:FLUCtuations:PST? <NRf+>
Parameters 1 to 1008
Examples MEAS:ARR:VOLT:FLUC:PST? 12
Returned Parameters 14 to 14,112 values
Related Commands ABORt SYSTEM:CONF INST:NSEL
MEAS:ARR:VOLT:FLUC:FLIC?
MEAS:ARR:VOLT:FLUC:ALL?