Test information, Pca9665, Nxp semiconductors – NXP Semiconductors PCA9665 User Manual
Page 78
PCA9665_2
© NXP B.V. 2006. All rights reserved.
Product data sheet
Rev. 02 — 7 December 2006
78 of 91
NXP Semiconductors
PCA9665
Fm+ parallel bus to I
2
C-bus controller
14. Test information
Test data are given in
.
R
L
= load resistance.
C
L
= load capacitance includes jig and probe capacitance.
R
T
= termination resistance should be equal to the output impedance Z
O
of the pulse
generators.
Fig 43. Test circuitry for switching times
Table 52.
Test data
Test
Load
S1
C
L
R
L
t
d(DV)
50 pF
500
Ω
V
DD
×
2
t
d(QZ)
50 pF
500
Ω
open
Test data are given in
.
R
L
= load resistance. R
L
for SDA and SCL > 1 k
Ω
(3 mA or less current).
C
L
= load capacitance includes jig and probe capacitance.
R
T
= termination resistance should be equal to the output impedance Z
O
of the pulse
generators.
Fig 44. Test circuitry for open-drain switching times
Table 53.
Test data
Test
Load
S1
C
L
R
L
t
d(DV)
50 pF
1 k
Ω
V
DD
t
d(QZ)
50 pF
1 k
Ω
V
DD
t
as(int)
50 pF
1 k
Ω
V
DD
t
das(int)
50 pF
1 k
Ω
V
DD
PULSE
GENERATOR
V
O
CL
50 pF
RL
500
Ω
002aac694
RT
V
I
V
DD
DUT
RL
500
Ω
V
DD
×
2
open
V
SS
PULSE
GENERATOR
V
O
CL
50 pF
RL
1 k
Ω
002aac695
RT
V
I
V
DD
DUT
V
DD
open
V
SS