Quantum 10K II User Manual
Page 57
Specifications
4-2
Quantum Atlas 10K II Ultra 160/m SCSI Hard Disk Drives
Table 4-1 Specifications (continued)
DESCRIPTION
QUANTUM
ATLAS 10K II
9.1 GB
QUANTUM
ATLAS 10K II
18.2 GB
QUANTUM
ATLAS 10K II
36.4 GB
QUANTUM
ATLAS 10K II
72.8 GB
Buffer Size
8 MB
8 MB
8 MB
8 MB
RELIABILITY:
Annualized Failure Rate (AFR)
1
No greater than
1.5%
No greater than
1.5%
No greater than
1.5%
No greater than
1.5%
Seek Error Rate
10 in 10
6
10 in 10
6
10 in 10
6
10 in 10
6
Recoverable Error Rate
10 in 10
12
10 in 10
12
10 in 10
12
10 in 10
12
Unrecoverable Error Rate
10 in 10
14
10 in 10
14
10 in 10
14
10 in 10
14
Grown Defects from
Environmental Change
(Maximum)
2
18
36
72
144
Minimum Contact Start/Stop
Cycles @ 25
°
C (77
°
F)
40,000
40,000
40,000
40,000
Auto Head-Park Method
AirLock® – with
magnetic bias
AirLock® – with
magnetic bias
AirLock® – with
magnetic bias
AirLock® – with
magnetic bias
NOTES
1
Projected AFR is from a predicted theoretical AFR for the Atlas 10K IIfamily of
products that is based on design (i.e., Bellcore) and historical data and does not
include process variance, returns with no trouble found, or handling and excessive
shock failures. Historically, the field AFR, which returns all returns regardless of cause,
has been 50 – 60% of the projected AFR. The development of an operational AFR
methodology and derating curve, in line with the IDEMA AFR standardization effort,
is underway. For more information, see the HDD Reliability White Paper on Quantum
Corporation’s World Wide Web site at www.quantum.com.
2
With AWRE and ARRE set to 1, the drive will add detected bad blocks to the Grown
Defect List and reallocate the data. A small number of grown defects can occur,
typically during the first 48 hours of I/O activity, as a result of significant
environmental change. This change includes specification extremes (altitude,
voltage, temperature, shock, vibration, etc.) not encountered during the
manufacturing test process. Environmental extremes and shocks encountered during
shipping and handling may also lead to grown defects.