HP StoreEver TapeAssure Software - Manual (Page 101)

DLT, DLT1, VS80, VS160, and SDLT Assessment tests performed:
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SCSI interconnect test
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Review event log entries (that were present prior to running this test)
•
Load the test tape
•
Quick write/read test
•
Soft unload/load test (DLT assessment test only)
•
Minimum block size test
•
Diagnostic self test (built-in drive function)
•
Read/write tests, using various data patterns
•
Bit error rate test
•
Review new event log entries added during the test
•
Unload the test tape
LTO Assessment tests performed:
•
Requires that a cartridge be already loaded or in the process of
loading when the test is started.
•
Looks at drive history (runs device analysis and looks at LTO reports
information).
•
Checks the test cartridge history to insure it is suitable for running
the test.
•
Checks whether the drive is requesting cleaning.
•
Performs an unload/load cycle, checking for any mechanical issues
•
Writes two wraps of data using varying tape speeds in both
directions measuring write and read-while-write margin
NOTE: The LTO Assessment test is updated for L&TT 4.2 SR1 to use
low I/O commands so the test can be performed using a slow host, such
as a laptop computer.
NOTE: If the drive to be tested in part of an autoloader or library, the
autoloader or library should be in random mode prior to running the
test.
DDS Assessment tests performed:
NOTE: L&TT versions 4.8 and above have two versions of the DDS
Assessment test. L&TT will offer the test applicable to your tape drive.
Original test
•
Review event log entries (that were present prior to running this test)
•
Check life data in the serial EEPROM and the fault log
•
Load check
•
Perform a clean and write test
•
Unload check
•
MRS switch test
Diagnostic tests 101