Vaisala WS425FG - Manual (Page 47)

Chapter 4 ________________________________________________________________ Operation
VAISALA_______________________________________________________________________ 45
WS Command
This command requests the verbose Built-In Test (BIT) results. The
command format is:
WS CR LF
The command gives a textual run down of the results of all Built-In
Tests (BITs). In every line except the bad reading counter, the pass/fail
indication is given with the single character P or F. This is followed by
the description of the parameter measured, which is followed by the
actual measured value. The Bad 1 second readings counter is a running
total of the number of fundamental 1 second readings that were flagged
as bad by the sensor. This number rolls over to zero after reaching a
count value of 65535. It is initialized to zero on each power-up or any
other activity that performs a re-initialization of the sensor.
The time measurement quality indices are given for path numbers
defined as follows:
- Path 0 is from south transducer to north transducer
- Path 1 is from north transducer to south transducer
- Path 2 is from north transducer to east transducer
- Path 3 is from east transducer to north transducer
- Path 4 is from east transducer to south transducer
- Path 5 is from south transducer to east transducer
A listing for the command response is given below with representative
values.
CR LF
P Heater voltage 22.3 Volts CR LF
P Array heater resistance 4.9 Ohms CR LF
P Heaters off voltage 0.1 Volts CR LF
P Incoming supply voltage 12.2 Volts CR LF
P 5.0 volt supply 5.05 Volts CR LF
P 10 volt supply 10.2 Volts CR LF
- Bad 1 second reading counter 0 CR LF
P Path 0 signal quality index 99 CR LF
P Path 1 signal quality index 99 CR LF
P Path 2 signal quality index 99 CR LF
P Path 3 signal quality index 99 CR LF
P Path 4 signal quality index 99 CR LF
P Path 5 signal quality index 99 CR LF