Crystal nVision Lab Reference - Manual (Page 43)

Safety and Certifications  41
nVision Operation Manual
EMC EC Declaration of Conformity
Note: These approvals apply only to the nVision Reference Recorder.
EMC EC Declaration of Conformity
Note: These approvals apply only to the nVision Lab Reference.
DECLARATION OF CONFORMITY
According to ISO/IEC 17050-1:2010
Manufacturer’s Name: Crystal Engineering Corporation
An AMETEK Inc. company
Manufacturer’s Address: 708 Fiero Lane, Suite 9
San Luis Obispo, CA 93401 USA
Declares under sole responsibility that the product as originally delivered
Product Name: Reference Recorder
Model Number: nVision Series
Complies with the essential requirements of the following applicable European Directives, and carries the CE marking accordingly:
EMC Directive 2004/108/EC
Standard EHSR
EN 55011:2006/ 55011:2007; +A2: 2007 (CISPR 11:2003) EN 55011:2009/A1:2010/CISPR 11:2009/A1:2010 harmonized standard has
been compared to the standard used for certification purposes and no
changes in the “state of the art” apply to the equipment. (1)
EN 61326: 2006 Harmonized
And conforms with the following product standards:
Standard Description Class Status EHSR
Pressure Modules (PM)
EN 55011:2006 (CISPR 11) Radiated Emissions Class B Pass See (1)
EN 61326-1:2006 ( EN 61000-4-2) Electrostatic Discharge Criteria A Pass (2) Harmonized
EN 61326-1:2006 (EN 61000-4-3) Radiated Immunity Criteria A Pass Harmonized
Current & Voltage Module (MA20)
EN 55011:2006 (CISPR 11) Radiated Emissions Class B Pass See (1)
EN 61326-1:2006 (EN 61000-4-2) Electrostatic Discharge Criteria A Pass Harmonized
EN 61326-1:2006 (EN 61000-4-3) Radiated Immunity Criteria A Pass Harmonized
Temperature Module (RTD100)
EN 55011:2006 (CISPR 11) Radiated Emissions Class B Pass See (1)
EN 61326-1:2006 (EN 61000-4-2) Electrostatic Discharge Criteria A Pass (3) Harmonized
EN 61326-1:2006 (EN 61000-4-3) Radiated Immunity Criteria A Pass Harmonized
Barometric Reference Module
EN 55011:2006 (CISPR 11) Radiated Emissions Class B Pass See (1)
EN 61326-1:2006 (EN 61000-4-2) Electrostatic Discharge Criteria A Pass Harmonized
EN 61326-1:2006 (EN 61000-4-3) Radiated Immunity Criteria A Pass Harmonized
(2) Pressure changed value and/or unit reset when ESD was applied to the PM module.
(3) Temperature changed value when ESD was applied to RTD100 module.
I hereby declare that the equipment named above has been designed to comply with the relevant sections of the above referenced specifications.
The unit complies with all essential requirements of the Directives
USA Signatory: European Signatory:
David K Porter, P.E.
Crystal Engineering Corporation, an AMETEK Inc. company
708 Fiero Lane, Suite 9, San Luis Obispo, CA 93401, USA
+1 805 595 5477
AMETEK Denmark A/S
Gydevang 32-34, 3450 Allerød, Denmark
+45 4816 8000
11 March 2014
______________________________
Division Vice President & Crystal Business Manager
DECLARATION OF CONFORMITY
According to ISO/IEC 17050-1:2010
Manufacturer’s Name: Crystal Engineering Corporation
An AMETEK Inc. company
Manufacturer’s Address: 708 Fiero Lane, Suite 9
San Luis Obispo, CA 93401
USA
Declares under sole responsibility that the product as originally delivered
Product Name: Reference Recorder
Model Number: NL LAB Series
Complies with the essential requirements of the following applicable European Directives, and carries the CE marking
accordingly:
EMC Directive 2004/108/EC
Standard EHSR
EN 55011 (CISPR 11:2003)
EN 55011:2009/A1:2010/CISPR 11:2009/A1:2010 harmonized standard
has been compared to the standard used for certification purposes and
no changes in the “state of the art” apply to the equipment. (1)
EN 61326: 2006 Harmonized
And conforms with the following product standards:
Standard Description Class Status EHSR
EN 55011 (CISPR 11:2003 Conducted Emissions Class A Pass See (1)
EN 55011 (CISPR 11:2003) Radiated Emissions Class A Pass See (1)
EN 61326-1:2006 ( EN 61000-3-2) Harmonics Pass Harmonized
EN 61326-1:2006 ( EN 61000-3-3) Voltage Fluctuations & Flicker Pass Harmonized
EN 61326-1:2006 ( EN 61000-4-2) Electrostatic Discharge Pass Harmonized
EN 61326-1:2006 (EN 61000-4-3) Radiated Immunity Pass Harmonized
EN 61326-1:2006 (EN 61000-4-4) Electrical Fast Transient / Burst Pass Harmonized
EN 61326-1:2006 (EN 61000-4-5) Surge Immunity Pass Harmonized
EN 61326-1:2006 (EN 61000-4-6) Conducted Immunity Pass) Harmonized
EN 61326-1:2006 (EN 61000-4-8) Magnetic Field Immunity Pass Harmonized
EN 61326-1:2006 (EN 61000-4-11) Voltage Dips & Interrupts Pass Harmonized
I hereby declare that the equipment named above has been designed to comply with the relevant sections of the above referenced
specifications. The unit complies with all essential requirements of the Directives
USA Signatory: European Signatory:
David K Porter, P.E.
Crystal Engineering Corporation, an AMETEK Inc. company
708 Fiero Lane, Suite 9, San Luis Obispo, CA 93401, USA
+1 805 595 5477
AMETEK Denmark A/S
Gydevang 32-34, 3450 Allerød, Denmark
+45 4816 8000
11 March 2014
______________________________
Division Vice President & Crystal Business Manager