Metrohm 861 Advanced Compact IC - Manual (Page 92)

4 Notes - Maintenance - Faults
861 Advanced Compact IC / Instructions for Use 8.861.1033
82
4.3 Faults and malfunctions
4.3.1 Error messages
If any type of malfunction occurs during operation of the 861 Advanced
Compact IC, this is shown by error messages in the PC program, which
appear either in an error window or in the SYSTEM STATE window.
Follow the instructions listed in the Error window and close this win-
dow with <OK> .
You will find further details of the error messages of the
SYSTEM STATE
window, their possible causes and the procedure for rectifying them in
the Software Instructions for Use «IC Net 2.3» Section 4.5.
4.3.2 Malfunctions and their rectification
If difficulties appear with The 861 Advanced Compact IC during analy-
ses, their causes are best investigated in the order separating column
→ high-pressure pump → eluent → connections. Several of The
malfunctions which may appear are listed in the following table with de-
tails of possible causes and countermeasures.
Malfunction Cause Rectification
Baseline with high
noise level, pulsa-
tion • Contaminated pump
valves
• Defective piston seals
• Clean the valves (see Sec-
tion 4.2.6)
• Replace the piston seals
(see Section 4.2.6)
Drift of the
baseline • Thermal equilibrium not
yet reached
• Leak in system
• Evaporation of organic
solvent in eluent
• Condition system with
heating switched on
• Check connections and
make leakproof
• Ensure better closure of
eluent supply vessel
Considerable
pressure drop • Leak in system • Check connections and
make leakproof
Considerable
pressure rise • Contamination of the fil-
ter in the 6.2821.120 Fil-
ter unit PEEK
• Blockage of the precol-
umn
• Change of column pack-
ing by injection of con-
taminated samples
• Replace the 6.2821.130
Filter (see Section 2.3.6)
• Change precolumn (see
Section 4.2.5)
• Regenerate column (see
Section 4.1.1) or replace
column (see Section 4.2.5)
Note:
Samples should always
be microfiltered.
Chromatograms
with poor resolu-
tion, change in the
retention times • Deterioration in separa-
tion efficiency of the IC
column • Regenerate column (see
Section 4.1.1) or replace
column