6 testability, Testability – Avago Technologies LSI53C1020 User Manual

Page 26

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1-12

Introduction

Version 2.4

Copyright © 2001–2004 by LSI Logic Corporation. All rights reserved.

•

Provides 2 kV electrostatic discharge (ESD) protection on SCSI
signals

•

Provides latch-up protection greater than 150 mA

•

Provides voltage feed-through protection

•

Supports the Integrated RAID (IR) solution to provide physical
mirroring or striping of the boot volume

•

Has a high proportion of power and ground pins

•

Provides power and ground isolation of I/O pads and internal chip
logic

•

Supports CRC checking and generation in double transition (DT)
phases

•

Provides comprehensive SureLINK Domain Validation technology:

–

Basic (Level 1) with inquiry command

–

Enhanced (Level 2) with read/write buffer

–

Margined (Level 3) with margining of drive strength and slew
rates

•

Supports TolerANT technology, which provides:

–

Active negation of SCSI Data, Parity, Request, and Acknowledge
signals for improved SCSI transfer rates

–

Input signal filtering on SCSI receivers for improved data
integrity, even in noisy cabling environments

1.8.6

Testability

These features enhance the testability of the LSI53C1020:

•

Allows all SCSI signals to be accessed through programmed I/O

•

Supports JTAG boundary scan

•

Provides ARM Multi-ICE

®

test interface for debugging purposes

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