Texas Instruments TMS320TCI6486 - Manual (Page 137)

www.ti.com EMAC Port Registers
5.39 Back Off Test Register (BOFFTEST)
The back off test register (BOFFTEST) is shown in Figure 81 and described in Table 75 .
Figure 81. Back Off Test Register (BOFFTEST)
31 26 25 16
Reserved RNDNUM
R-0 R-0
15 12 11 10 9 0
COLLCOUNT Reserved TXBACKOFF
R-0 R-0 R-0
LEGEND: R = Read only; -n = value after reset
Table 75. Back Off Test Register (BOFFTEST) Field Descriptions
Bit Field Value Description
31-26 Reserved 0 Reserved
25-16 RNDNUM Back off random number generator. This field allows the Back off Random Number Generator to be
read. Reading this field returns the generator's current value. The value is reset to zero and begins
counting on the clock after the de-assertion of reset.
15-12 COLLCOUNT Collision count. These bits indicate the number of collisions the current frame has experienced.
11-10 Reserved 0 Reserved
9-0 TXBACKOFF Back off count. This field allows the current value of the back off counter to be observed for test
purposes. This field is loaded automatically according to the back off algorithm, and is decremented
by one for each slot time after the collision.
137 SPRUEF8F – March 2006 – Revised November 2010 C6472/TCI6486 EMAC/MDIO
Submit Documentation Feedback
Copyright © 2006–2010, Texas Instruments Incorporated