IDEC DATAVS2 Series - Manual (Page 30)

SVS2 Series Instruction Manual
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6.4. STEP 3
In this final step of the configuration process, you may:
• set output settings (Set Up Outputs);
• start a Test, i.e. run set controls on stored images;
• activate Run, i.e. run set controls on the images from the sensor;
• turn on monitor mode (Start button), which displays system statistics.
Please note that the outputs are disabled in Run mode and images are still processed on the personal
computer. The sensor simply acquires the images: no specified inspection instruction stored in its
memory will be altered. This is an advanced test mode that allows selected controls to be tested
straight in the inspection line to determine their effectiveness.
6.4.1. Outputs Setup
Once selected, the system shows the configuration panel for sensor outputs in the Control Panel; the
sensor has three configurable digital outputs and you can set the behaviour, duration and delay for
each output; duration and delay are available for all three outputs.
• Mode Associates a certain output value to a given result
(part OK, reject, toggle, Busy-Ready, etc.), using positive or negative logic.
• Duration Determines how long (ms) the output is to retain the last value acquired; only makes
sense in Part Detect, Part Pass and Part Fail modes.
• Delay Determines how long the output should wait before displaying the last result acquired.
L’opzione Salvataggio Immagini permette di salvare nella memoria del sensore fino a 10 immagini.
Il parametro Pulsante Teach, infine, consente di abilitare o disabilitare la funzione di Teach del pulsante
sul sensore.
Option Save Images lets you save up to 10 images
to sensor memory.
The Teach Button parameter lets you enable or disable the Teach function of the button on the sensor.
The control panel lists the three digital outputs, which may be set individually.
As a matter of fact, the system lets you connect the following items to one or more outputs:
• result of a control;
• result of whole inspection in AND operation;
• result of whole inspection in NAND operation;
• a toggle signal alternately switching to high or low;
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