Controls, Pass / fail acquired image inspection – IDEC DATAVS2 Series User Manual

Page 43

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Instruction

Manual

SVS2

Series

38

8.5. Controls

The controls are tools used to set inspection specifications.


The SVS2 system offers a broad range of controls:

Name

Available in OR version

Available in AOR version

Brightness

Contrast

Contour Match

Edge Count

Width

Pattern Match

Position

Geometric Pattern Match


This way, the system can be adapted to meet specific inspection requirements. Controls may be
selected from the pull-down menu:


In its most basic version, the inspection process may be simplified as follows:









This simple control consists in acquisition and one single measurement/control, which will return a
certain result.

Control/

Measurement

Pass /

Fail

Acquired

Image

INSPECTION

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