10 time skew between measurements – Campbell Scientific CR3000 Micrologger User Manual
Page 299

Section 8. Operation
299
Table 62. Calibrate() Instruction Results
Descriptions of Array Elements
Array
Cal()
Element
Differential (Diff)
Single-Ended (SE)
Offset or Gain
±mV Input
Range
Integration
Typical Value
24
Gain 200
60-Hz
Rejection
-0.00667
mV/LSB
25
SE
Offset
50
60-Hz Rejection
±30 LSB
26 Diff
Offset
50 60-Hz Rejection
±30 LSB
27
Gain
50
60-Hz
Rejection
-0.00167
mV/LSB
28
SE
Offset
20
60-Hz Rejection
±35 LSB
29 Diff
Offset
20 60-Hz Rejection
±35 LSB
30
Gain
20
60-Hz
Rejection
-0.00067
mV/LSB
31
SE
Offset
5000
50-Hz Rejection
±25 LSB
32 Diff
Offset
5000
50-Hz Rejection
±25 LSB
33
Gain 5000
50-Hz
Rejection
-0.167
mV/LSB
34
SE
Offset
1000
50-Hz Rejection
±25 LSB
35 Diff
Offset
1000
50-Hz Rejection
±25 LSB
36
Gain 1000
50-Hz
Rejection
-0.0333
mV/LSB
37
SE
Offset
200
50-Hz Rejection
±30 LSB
38 Diff
Offset
200
50-Hz Rejection
±30 LSB
39
Gain 200
50-Hz
Rejection
-0.00667
mV/LSB
40
SE
Offset
50
50-Hz Rejection
±30 LSB
41 Diff
Offset
50 50-Hz Rejection
±30 LSB
42
Gain
50
50-Hz
Rejection
-0.00167
mV/LSB
43
SE
Offset
20
50-Hz Rejection
±35 LSB
44 Diff
Offset
20 50-Hz Rejection
±35 LSB
45
Gain
20
50-Hz
Rejection
-0.00067
mV/LSB
8.1.2.10 Time Skew Between Measurements
Time skew between consecutive voltage measurements is a function of settling
and integration times, A/D conversion, and the number entered into the
Reps
parameter of the VoltDiff() or VoltSE() instruction. A close approximation is:
Time Skew = Settling Time + Integration Time + A‐D Conversion Time
1
+
Reps/NoReps
2
1
A/D (analog-to-digital) conversion time = 125 µs
2
Reps/No Reps -- If Reps > 1 (i.e., multiple measurements by a single instruction), no additional time
is required. If Reps = 1 in consecutive voltage instructions, add 15 µs per instruction.