10 time skew between measurements – Campbell Scientific CR3000 Micrologger User Manual

Page 299

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Section 8. Operation

299

 

Table 62. Calibrate() Instruction Results

Descriptions of Array Elements

Array

Cal()

Element

Differential (Diff)

Single-Ended (SE)

Offset or Gain

±mV Input

Range

Integration

Typical Value

24

Gain 200

60-Hz

Rejection

-0.00667

mV/LSB

25

SE

Offset

50

60-Hz Rejection

±30 LSB

26 Diff

Offset

50 60-Hz Rejection

±30 LSB

27

Gain

50

60-Hz

Rejection

-0.00167

mV/LSB

28

SE

Offset

20

60-Hz Rejection

±35 LSB

29 Diff

Offset

20 60-Hz Rejection

±35 LSB

30

Gain

20

60-Hz

Rejection

-0.00067

mV/LSB

31

SE

Offset

5000

50-Hz Rejection

±25 LSB

32 Diff

Offset

5000

50-Hz Rejection

±25 LSB

33

Gain 5000

50-Hz

Rejection

-0.167

mV/LSB

34

SE

Offset

1000

50-Hz Rejection

±25 LSB

35 Diff

Offset

1000

50-Hz Rejection

±25 LSB

36

Gain 1000

50-Hz

Rejection

-0.0333

mV/LSB

37

SE

Offset

200

50-Hz Rejection

±30 LSB

38 Diff

Offset

200

50-Hz Rejection

±30 LSB

39

Gain 200

50-Hz

Rejection

-0.00667

mV/LSB

40

SE

Offset

50

50-Hz Rejection

±30 LSB

41 Diff

Offset

50 50-Hz Rejection

±30 LSB

42

Gain

50

50-Hz

Rejection

-0.00167

mV/LSB

43

SE

Offset

20

50-Hz Rejection

±35 LSB

44 Diff

Offset

20 50-Hz Rejection

±35 LSB

45

Gain

20

50-Hz

Rejection

-0.00067

mV/LSB

 

8.1.2.10 Time Skew Between Measurements

Time skew between consecutive voltage measurements is a function of settling
and integration times, A/D conversion, and the number entered into the

Reps

parameter of the VoltDiff() or VoltSE() instruction. A close approximation is:

Time Skew = Settling Time + Integration Time + A‐D Conversion Time

1

 + 

Reps/NoReps

2

 

1

A/D (analog-to-digital) conversion time = 125 µs

2

Reps/No Reps -- If Reps > 1 (i.e., multiple measurements by a single instruction), no additional time

is required. If Reps = 1 in consecutive voltage instructions, add 15 µs per instruction.

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