Acquisition, Technology, Measurement specifications – VXI VT1422A User Manual

Page 527

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Acquisition

Acquisition

Technology

VXI

Acquisition

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213

Algorithmic Closed Loop Controller and

Remote Channel Multifunction

VT1415A/1422A

Timing Signals

Timing:

Scan-to-scan timing and

sample-to-sample

timing can be set

independently.

Scan triggers:

Can be derived from a software

command or a TTL level from

other VXI modules, internal timer,

or external hardware.

Typical latency 17.5 µs.

Synchronization:

Multiple VT1415A/VT1422A

modules can be synchronized

at the same rate using the TTL

trigger output from one

VT1415A/VT1422A to trigger

the others.

Alternate

Multiple VT1415A/VT1422A

synchronization:

modules can be synchronized at

different integer-related rates

using the ALG:SCAN:RATIO

command and the TTL trigger

output from one VT1415A/

VT1422A module to trigger

the others.

Scan Triggers

Internal:

100 µs to 6.5536 s

Resolution:

100 µs

Trigger count:

1 to 65535 or infinite

Sample Timer

VT1415A: 10 µs to 32768 ms

Range:

VT1422A: 40 µs to 32768 ms

Resolution:

0.5 µs

Measurement Specifications

The following specifications include the SCP and scanning

A/D performance together as a unit. Accuracy is stated for

a single sample. Averaging multiple samples will improve

accuracy by reducing noise of the signal. The basic VT1415A

scanning A/D has a full-scale range of ±16 V and five auto-

ranging gains of x1, x4, x16, x64, and x256. An SCP must be

used with each eight channel input block to provide input

protection and signal conditioning.

Note: For field wiring, the use of shielded twisted pair
wiring is highly recommended.

Measurement resolution:

16 bits (including sign)

Maximum reading rate:

VT1415A: Up to 56 kSa/s

dependent upon configuration

VT1422A: Up to 25 kSa/s

dependent upon configuration

Memory:

64 kSamples

Maximum input voltage:

Normal mode plus

common mode

Operating:

±16 V peak

Damage level:

±42 V peak

Maximum common mode voltage:

Operating:

±16 V peak

Damage level:

±42 V peak

SCP input impedance:

100 MΩ differential

Maximum tare cal offset:

62.5 mV range ±75% of full

scale, other ranges ±25%

of full-scale

Jitter:

Phase jitter scan-to-scan:

80 ps rms

Phase jitter card-to-card:

41 ns peak 12 ns rms

Measurement Accuracy

Typically ±0.01% of input level; varies with the SCP used.

Specifications are 90 days, 23 °C ± 1 °C, with *CAL done after

a 1hr warm-up and CAL:ZERO done within 5 minutes. Note:

Beyond the 5min. limitation and CAL:ZERO not done, apply the

following drift error: Drift = 10 µV/°C ÷ SCP gain, per °C change

from CAL:ZERO temperature.

Accuracy Data

Measurement accuracy is dependent upon the SCP module used.

Refer to the accuracy tables and graphs for the individual SCP to

determine the overall measurement accuracy.

Many definitions of accuracy are possible. Here we use single-

shot with 3 sigma noise. To calculate accuracy

assuming

temperature is held constant within ±1 °C of the temperature at

calibration, the following formula applies:

Single Shot 3σ = ±(√((GainError)2 + (OffsetError)2+ (3σ noise)2))

Correcting for Temperature

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