Test 52 pull0_xtrig, Test 24 pull0_trigqal - 8 – Fluke 900 User Manual
Page 43
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FLUKE 900 SERVICE MANUAL
Selftest
#16
79.000 n
120.00 n
161.00 n
IXuation - BitO
#17
199.00 n
240.00 n
281.00 n
Duration - Bitl
#18
439.00 n
480.00 n
521.00 n
Duration - Bit2
#19
919.00 n
960.00 n
1.0010 u
Duration - Bit3
#20
1.8790 u
1.9200 u
1.9610 u
Duration - Bit4
#21
3.7990 u
3.8400 u
3.8810 u
Duration - Bit5
#22
7.6390 u
7.6800 u
7.7210 u
Duration - Bit6
#23
15.319 u
15.360 u
15.401 u
Duration - Bit7
#24
119.00 n
120.00 n
241.00 n
Delay - BitO
#25
239.00 n
240.00 n
361.00 n
Delay - Bitl
#26
479.00 n
480.00 n
601.00 n
Delay - Bit2
#27
959.00 n
960.00 n
1.0810 u
Delay - Bit3
#28
1.9190 u
1.9200 u
2.0410 u
Delay - Bit4
#29
3.8390 u
3.8400 u
3.9610 u
Delay - Bit5
#30
7.6790 u
7.6800 u
7.7610 u
Delay - Bit6
#31
15.359 u
15.360 u
15.441 u
Delay - Bit7
#32
79.000 n
120.00 n
201.00 n
DGATE Inversion Test
#33
229.00 n
320.00 n
401.00 n
DGATE Infinite Duration Test
TEST 52
PULL0_XTRIG
If the Simulation Option (900-001) is installed, this test verifies the operation of the trigger
circuit inside the shadow RAM ASIC chip configured for extended trigger. It walks a 0
through each line on the puU-ups latches and tries to trigger on each event
3 - 1 9