Test e62 walk_monleds, Test e63 update_vcc_lim, Teste62walkmonleds - 2 3 – Fluke 900 User Manual
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FLUKE 900 SERVICE MANUAL
Selftest
Byte 1 - bit 7 is set if any overlay failed. The other bits indicate which overlay failed
first When one overlay fails the remaining ones are not tested. They are
tested in ascending order.
0000 - SYSCOM, SYSB or SYSD
0001 - SEQ, SYSB or SYSD
0010-
COMPIL, SYSB or SYSD
0011-
USER, SYSB or SYSD
0100-
MATH, SYSB or SYSD
0101-
DISP, SYSB or SYSD
0110 - COM, SYSB or SYSD
0111 - FILE_U, SYSB or SYSD
1010-RDTEST, SYSAForSYSC
1011 - SLFTST, SYSAF or SYSC
1100-
MISC, SYSAForSYSC
1101-
EDITOR,
SYSAForSYSC
1110 -
LOG,
SYSAF or SYSC
nil-OTHER,
SYSAForSYSC
Byte 2 -
data bits that failed when the SRAM was tested.
Byte 3 -
This indicates the DRAM chips that failed on earlier Micro boards that used 8
DRAM chips. For boards that have 2 DRAM devices only at U82 and U86, any
bit can indicate either of the DRAMs.
B7-U86
B6-U82
B5 - U87
B4 - U83
B3-U88
B2 - U84
B1-U89
BO - U85
TEST E62
WALK_MONLEDS
This test turns off all of the MONITOR LED’s and walks each one on. It then turns on aU of
the LED’s and walks each one off. This test is visual and is not executed during power-up
selltest.
TEST E63
UPDATE_VCC_LIM
This test reads the current value of Vcc on the buffer and updates the stored minimiini and
maximum readings if necessary.
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