Test 54 pull_xevent, Test 55 shadjnit, Test55shadinit - 2 1 – Fluke 900 User Manual
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FLUKE 900 SERVICE MANUAL
Selftest
TEST 54
PULL_XEVENT
If the Simulation Option (900-001) is installed, this test verifies the operation of the event
counter inside the shadow RAM ASIC chip configured for extended trigger. The tests are as
follows:
1.
Circuit configured as: EVENT-CLOCK=EQUAL, CLOCK-ENABLE=MATCH
- Check for false clocking (clocking with CLOCK-ENABLE inactive)
- Check for proper counting (set count = 255 and provide 255 clocks)
2.
Circuit configured as: EVENT-CLOCK=MATCH, CLOCK-ENABLE=TSTON
- Check for false clocking (clocking with CLOCK-ENABLE inactive)
- Check for proper counting (set count = 255 and provide 255 clocks)
The results are interpreted as follows:
I B7 I B6 I B5 I B4 I B3 I B2 I B1 | BO |
[BYTE 01
0 1
I
1
I
|1-PTC|1-NTC|1-CDIS|
I BYTE II 1-C7I 1-C6I
1-C5I 1-C4I 1-C31 1-C21 1-Cl| 1-CO |
I BYTE 2 I
I
I
I
I
I2-PTCI2-NTCI2-CDISI
I BYTE 31 2-C7I 2-C6I
2-C51 2-C4| 2-C31 2-C21 2-Cl| 2-CO |
NOTE: l-x,2-x refer to configurations 1 and 2 as described above.
PTC-
Premature
Terminal
Count
The
terminal
count
was
reached
before
expected. The following byte indicates the munber of clocks which
occurred when terminal count was reached.
NTC- No Terminal Count Terminal count did not occur after supplying 255
clocks.
CDIS- Count Disable. The event counters clock-enable line is not functioning,
allowing the counter to count when clock-enable is inactive.
TEST 55
SHADJNIT
If the Simulation Option (9(X)-(X)1) is installed, this tests the shadow RAM initialization and
readback functions using the SRAM master pattern.
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