Test e64 shad_addr, Test e70 key_closure, Test e71 disp_ram – Fluke 900 User Manual
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FLUKE 900 SERVICE MANUAL
TEST E64
SHAD_ADDR
The shadow RAM addressing test takes ^proximately 3 minutes to run.
RESULT BYTES:
I
B7
I B6 I B5 I B4 I B3 I B2 I
B1 | BO
|
I
BYTE
0 I
WR I
ADD | ADD
I
I
I
I
I
I
+ -------------------+ ------------------ + ---------------- + ---------------- + ---------------+ ---------------- + ----------------- + ------------------+ ------------ +
I BYTE 1| PT
I
NT
I
I
I
I
I
I
I
+ -------------------+ -------------------+ ---------------- + ---------------- + ---------------+ ---------------- + ----------------- + ------------------+ ------------ +
IBYTE 21 A15
I A14 | A13 | A12 | All | AlO |
A9 | A8
|
- + ---------------+
I
AO I
-+--- +
I BYTE 3 I A7 I A6 I A5 I A4 | A3 | A2 | A1
ADD - Failed addressing test on LCA at U105 of High Speed Board.
Result bytes 2 and 3 identify the address lines in error.
WR -The byte written was not verified immediately after being written.
PT - Premature termination of initialization cycle.
NT - Initialization cycle not terminated.
TEST E70
KEY_CLOSURE
This test asks the operator to press the indicated key. When the key is pressed, the test
moves on to the next key, approximately 150 combinations in all. This test does not return
results in memory.
TEST E71
DISP_RAM
This test performs a ramtest of the display’smemory. Results returned are as follows:
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