Test e74 disp_char_set, Test e75 cart_slft, Test e76 test_c_eng – Fluke 900 User Manual
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FLUKE 900 SERVICE MANUAL
Seiftest
B7 B6
B5
B4
B3
B2
B1 BO
BYTE 0
I 0
|BUSY|DATA|ADDR|A11
'lAlO | A91
A8|
BYTE 1
I A7I A6
I
A5
I
A4 | A3
1
A2 | A1|
AO|
BYTE 2
I D7| D6 | D5 | D4 | D3 | D2 | D1|
DO|
BYTE 3 | 0 | 0 1
0
1
0
1
0
1
0
l
O
I
O
I
BUSY - Indicates that the display is always busy
DATA -
Indicates that the data bit test failed (results in byte 2)
ADDR -
Indicates that the address bit test failed (results in bytes 0 & 1)
NOTE:
The DATA and ADDR tests are not executed if the BUSY test fails.
TEST E74
DISP_CHAR_SET
This test writes the character set to the screen. The order is not by ASCII code but rather by
logical character grouping. This test returns no results in memory.
TEST E75
CART_SLFT
This test formats the cartridge. It is intended for "BURN-EN". This test returns no results in
memory.
TEST E76
TEST_C_ENG
This is a similar test to TEST_CYCLE (49).
The only difference is that the RD power line is momentarily shorted to verify that an
interrupt caused by a shorted RD is handled properly.
TEST E77
ACT_CROSS
This test verifies that there is no cross talk between lines that can affect activity circuit The
line being checked is held low while all other lines are toggled. The line is then held high
while aU other lines are toggled. The activity circuit is used to tr^ any activity on the inactive
line.
This test cannot be executed with a clip inserted.
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