Toshiba TECRA S1 - Manual (Page 108)

3 Diagnostic Programs 3.6 Memory Test
34 TECRA S1Maintenance Manual
Extended Memory Start Address and Extended Memory End
Address (MB): Set the range of extended memory that is to be tested.
The test coverage will base on the value setting in ‘Percent (%)’
mentioned at below.
Percent (%): Choose the percentage of the defined range of the
memory to be tested.
1. Write/Read Cycle Test
Test by using both read and write instructions.
2. Read Cycle Test
Test by using read instructions.
Subtest 04 Walking 1’s Test
The test item is to make sure that there is no short circuitry issue in memory chip.
The parameter dialog window is the same as that in ‘Subtest 02 Pattern’.
Subtest 05 Walking 0’s Test
The test item is to make sure that there is no open circuitry issue in memory chip.
The parameter dialog window is the same as that in ‘Subtest 02 Pattern’.
Subtest 06 Memory Address
This test item is to check short and open issue on memory address lines.
Subtest 07 Refresh Test
This test item is to check whether the memory refresh works normally. The
parameter dialog window is as follows:
Subtest 08 Cache Memory