HEIDENHAIN ND 1400 - Manual (Page 48)

34 QC-300 Series User’s Guide
Friction probes must be qualified each time the probe position is changed.
Probe qualification can be performed at any time. A measurement sequence can be interrupted to qualify
a new probe tip or position without invalidating the measurement.
To qualify a probe:
1 Touch the probe icon to display the Se-
lector and Property tabs. The Selector tab
is displayed only for the star and indexable
probes.
2 Select the appropriate indexable probe angles or a star probe tip if a star or
indexable probe is being qualified.
NOTE
Qualify the straight-down (0°, 0°) probe position of star and indexable probes first.
All subsequent probe positions will be referred to this (0°, 0°) position.
3 Touch the Properties tab to display the probe
offset and size fields.
4 Touch the Teach button to initiate a probe
qualification. Collect 5 points on the qualification
sphere; 4 around the equator and 1 at the top. Press
the Finish key to complete the qualification ses-
sion.
The tip size will be shown in the Size field. The X,
Y and Z offsets are also shown, and will be zero for
the straight-down (0°, 0°) reference position. When
other star probe or indexable probe positions are
qualified, X, Y and Z offsets will also be shown.
Only probe tip size is
shown for 0, 0 position
X, Y and Z offsets are
shown for other positions