Fairbanks H90-5200-A Digital Instrument - Manual (Page 57)

APPENDIX XII: SUMMARY OF ERROR MESSAGES
“- -OL - -” Overload - An error will occur if the gross weight on the platform exceeds the instrument’s
programmed capacity by 5 percent.
“- -UL - -” Underload -The weight signal from the platform to the instrument is less than the A/D
converter’s minimum required signal strength for a resolvable weight.
“Error “ Key inhibited Error -This error message will be displayed if a key is pressed which had
been inhibited by the “key inhibit” programming.
“E1 L “ Error 1, Number of Graduations too Low - When changing the instrument’s division size
from the front panel an error will occur if the resulting number of scale graduations is less
than 100. To correct this error, the scale division size must be reduced.
“E1 H “ Error 1, Number of Divisions too High - When changing the instrument’s division size from
the front panel:
An error will occur if the resulting number of scale divisions exceed 10,000.
To correct this error, the instrument’s division size must be increased.
“E2L “ Error 2, Counts per Division too Low – When calibrating the instrument and:
the security level is at 0, an error will occur if the ratio of counts per division is less than 1.
if the security level is at 1 or 2, an error will occur if the ratio of counts per division is less
than 3. In either instance, the error is the result of too few counts, or too large a division
size. It may be corrected by reducing the scale division size.
“E2H “ Error 2, Counts per Division too High – When calibrating the instrument and the resulting
number of total counts exceeds 132,000 an error will occur. Total counts is the sum of the
zero counts and the span counts. This error may be corrected by increasing the scales
division size.
“r PASS” RAM Test, Pass - The RAM test verifies the operation of the processor’s external memory
device.
“r FAIL’ RAM Test, Fail – The RAM test verifies the operation of the processor’s external memory
device. This IC is located at U7 of the main PCB and should a failure occur, replace the IC
and the battery backed Real Time Clock in U7 with a new “Clock Kit” (see “Parts List”).
“E PASS” EEPROM Test, Pass - The EEPROM test verifies the operation of the processors external
non-volatile memory device.
“E Fail” EEPROM Test, Fail - The EEPROM test verifies the operation of the processors external
non-volatile memory device. This IC is located at Ul of the main PCB. The EEPROM is not
a field serviceable component. In the event of an EEPROM failure, replace the main PC
Board (see” Parts List”).
“S tESt” Keypad Switch Test Enabled - In this mode, the user may verify the proper operation of the
front panel keypad. Each key, when pressed, will generate a corresponding character on
the instrument display.
50515 57 Issue #2 4/04