Document Outline

• Table of Contents
• 1 Service Manual Introduction
• 1.1 Description of Operator, Service Manuals
• 1.2 Basic Operation of Keyboard and Display
• 2 Theory of Operation
• 2.1 General
• 2.2 Interface Buffer
• 2.3 Micro Board
• 2.4 High Speed Board
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• 2.5 Test Clips
• 3 Selftest
• 3.1 Reading Selftest Results
• 3.1.1 General Selftest Results
• 3.1.3 Chip Size LED Error Codes
• 3.2 Running and Reading Individual Selftests
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• 3.3 Individual Selftest Descriptions
• TEST 0 SLFT_CLIP
• TESTS 1 2
• PULLO_MON, PULL1_MON
• TESTS 3,4
• PULL0_FLT, PULL1_FLT
• TESTS 5,6
• SYNCO_Hres_FLT, SYNCl_Hres_FLT
• TESTS 7 8
• SYNC0_Lres_FLT, SYNC1_Lres_FLT
• TESTS 9,10
• PINDISO_FLT, PINDIS1_FLT
• TESTS 11,12
• SLFTSTO_FLT, SLFTST1_FLT
• TESTS 13,14 VccON_FLT, GndON_FLT
• TEST 15 PULLPOS_FREQ
• TESTS 16,17
• TRIGQALO_EQUAL, TRIGQAL1_EQUAL
• TESTS 18,19
• QAL0_EQUAL, QAL1_EQUAL
• TRIGO_EQUAL, TRIG1_EQUAL
• TESTS 22 23
• PULLO_TRIG_EQUAL, PULL1_TRIG_EQUAL
• TESTS 25,26
• FM_STAT_NFLT, FM_STAT_FLT
• TEST 27
• FMASK_WB_TEST
• TEST 28 FMASK_CAL
• TESTS 29,31,33,35,37,39 FMxx_FLT
• TESTS 30,32,34,36,38,40 FMxx_NFLT
• TEST 41 ACT_DIS_CLR
• TESTS 42 43
• PULLO_ACT_TSTON, PULL1_ACT_TSTON
• TESTS 44, 45
• PULLO_ACT_ACTSTR, PULL1_ACT_ACTSTR
• TESTS 46,47
• Interface Buffer shift register subtest
• Frequency HW subtest
• Threshold HW subtest
• Reset HW subtest
• Result bytes:
• TEST 48
• KEYBOARD_OPEN
• TEST 49 TEST_CYCLE
• TEST 50 UART_TEST
• TEST 51 DGATE_TEST
• TEST 52 PULL0_XTRIG
• TEST 53 PULL1_XTRIG
• TEST 54 PULL_XEVENT
• TEST 55 SHADJNIT
• TEST E60 WALK_SIZELEDS
• TEST E61 TEST_MEMORY
• TEST E62 WALK_MONLEDS
• TEST E63 UPDATE_VCC_LIM
• TEST E64 SHAD_ADDR
• TEST E70 KEY_CLOSURE
• TEST E71 DISP_RAM
• TEST E74 DISP_CHAR_SET
• TEST E75 CART_SLFT
• TEST E76 TEST_C_ENG
• TEST E77 ACT_CROSS
• TEST E78 TRG_CROSS
• TEST E79 FRQ_CROSS
• TEST E80 FLT_CROSS
• 3.4 System Error Codes
• 4 Troubleshooting
• 4.1 Test Result Interpretation
• 4.2 Selftest / Circuit Block Reference Table
  • FLUKE 900 SERVICE MANUAL
• 4.3 Selftest Circuit Block Diagrams
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  • 4.4.2 Static-blown HSB
  • 4.4.3 Missing -5 V
  • 5.3.2 Keyboard
  • 5.3.3 Speaker
  • 5.3.4 Display Controller
  • 5.3.5 Display
  • 5.3.6 High Speed Board
  • 5.3.7 Power Supply
  • 5.3.7.1 Fan
  • 5.3.8 Interface Buffer Board
  • 5.4 Calibration Procedures
  • 5.4.1 Interface Buffer Calibration
  • 5.4.2 High Speed Board Calibration
  • 5.4.2.1 Calibration Data Format
  • S.4.2.4 The Offset Shift (OS) Definition
  • 5.4.2.4.1 Example 1 (for negative offsets)
  • 5.4.2A.2 Example 2 (for positive offsets)
  • 5.4.2.5 The Correcting Component Definition
  • S.4.2.6 Calibration Procedure
  • 5.4.2.6.1 Offsets Block
  • 5.4.2.6.2 Limits Block
    • pin#
  • 5.4.2.6.3 Selftest buffer and 86 gate related condition
    • fig.2
  • 5.4.2.6.4 LM360 comparator related condition
  • 5.5 Board Revisions, Upgrades and ECOs
  • 5.5.1 Modification to MB for 64k Cartridges
  • 5.5.2 900 System Firmware
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  • 7.1 900 Final Assembly
  • 7.2 A1 Interface Buffer IB
  • 7.3 A2 Micro Board M2
  • 7.4 A3 High Speed H3
  • 7.5 A4 Power Supply Module PA