Advanced configuration – ALTANA Micro-Wave-Scan Manual User Manual

Page 41

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Advanced Configuration

10. Advanced Configuration

10.1 Correction

Defects on the sample surface, such as scratches

or craters, can cause major errors in measurement

values. When Correction is activated, the affected

scan areas are cut out and the measurement

values are calculated from the sanitized data.

Pressing “operate” turns Correction on and off.

10.2 Plausibility Control

An option for comparing the corrected and

uncorrected measurement value. The greater the

difference between the corrected and uncorrected

data, the more critical is the surface defect. If the

difference is greater than 20 %, the measurement

will be evaluated as a faulty measurement. An

error message appears and a new measurement is

then needed.

Pressing “operate” turns Plausibility Control on and

off.

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