Caution – HT instruments PVCHECK User Manual

Page 22

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PVCHECK

EN - 20

5.6.

DB – DATABASE MODULE MANAGEMENT

The meter allows managing up to a maximum of 30 different types of PV modules,
further to a DEFAULT module (not editable and not erasable) which can be used as
reference case when no piece of information about the type of module being tested is
available.

The parameters, referred to 1 module, which can be set are described below in Table 1
together with their measuring range, resolution and validity condition.

Symbol Description

Range

Resol.

Conditions

Nms

Number of modules per string

1

 50

1

Pmax

Maximum rated power of module

50

 3200W

1W

01

.

0

max

max

P

I

V

P

mpp

mpp

Voc Open-circuit

voltage

15.00

 99.99V

100.0

 320.0V

0.01V

0.1V

Voc

 Vmpp

Vmpp

Voltage on maximum power point

15.00

 99.99V

100.0

 320.0V

0.01V

0.1V

Voc

 Vmpp

Isc Short-circuit

current 0.5

 9.99A

0.01A

Isc

 Impp

Impp

Current on maximum power point

0.5

 9.99A

0.01A

Isc

 Impp

Toll -

Negative tolerance for Pmax provided

by the module manufacturer

0%

 25.0%

0.1%

100*Tol

-

/Pnom< 25

0

 99W

1

Toll +

Positive tolerance for Pmax provided

by the module manufacturer

0

 25%

0.1%

100*Tol

+

/Pnom< 25

0

 99W

1

Alpha

Isc temperature coefficient

-0.100

0.100%/°C 0.001%/°C

0.1*Alfa / Isc

 0.1

-9.99

 9.99mA/°C 0.01mA/°C

Beta

Voc temperature coefficient

-0.99

 -0.01%/°C

0.01%/°C

100*Beta/Voc

 0.999

-0.999

 0.001V/°C 0.001V/°C

Gamma

Pmax temperature coefficient

-0.99

 -0.01%/°C

0.01%/°C

NOCT

Rated working temperature of cell

0

 100°C

1°C

Tech.

Effects due to module technology

STD (standard),
CAP (capacitive

eff.)

Rs

Internal serial resistance

0.00

 10.00 0.01

Table 1: Typical parameters of PV modules

CAUTION

 “Tech” is referred to the choice of the technology of the module being

tested. Select the “STD” option in case of test on “STANDARD” PV modules
or the “CAP” option in case of test on PV modules with remarkable
capacitive effects (e.g. HIT/HIP technology).

 A wrong choice of the type of technology can lead to a negative outcome of

the final test.

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