FUJITSU MHZ2250BJ User Manual

Page 143

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5.3 Host Commands

Table 5.21 Selective self-test log data structure

Byte(hex) Item

00, 01

Data Structure Revision Number

02 to 09

Starting LBA

0A to 11

Test Span 1

Ending LBA

12 to 19

Starting LBA

1A to 21

Test Span 2

Ending LBA

22 to 29

Starting LBA

2A to 31

Test Span 3

Ending LBA

32 to 39

Starting LBA

3A to 41

Test Span 4

Ending LBA

42 to 49

Starting LBA

4A to 51

Test Span 5

Ending LBA

52 to 151

Reserved

152 to 1EB

Vender Unique

1EC to 1F3

Current LBA under test

1F4 to 1F5

Current Span under test

1F6 to 1F7

Feature Flags

1F8

Offline Execution Flag

1F9

Selective Offline Scan Number

1FA, 1FB

Vender Unique

Reserved

1FC, 1FD

Selective Self-test pending time [min]

1FE, 1FF

Checksum

Test Span

Selective self-test log provides for the definition of up to five test spans. If the
starting and ending LBA values for a test span are both zero, a test span is not
defined and not tested.

Current LBA under test

As the self-test progress, the device shall modify this value to contain the LBA
currently being tested.

C141-E280

5-69

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