Embedded system diagnostics testing options, Using the custom test options, Selecting devices for testing – Dell PowerVault NX3000 User Manual

Page 169: Selecting diagnostics options

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Running the System Diagnostics

169

Embedded System Diagnostics Testing Options

Click the testing option in the Main Menu window.

Using the Custom Test Options

When you select Custom Test in the Main Menu window, the Customize
window allows you to select the device(s) to be tested, select specific options
for testing, and view the test results.

Selecting Devices for Testing

The left side of the Customize window lists devices that can be tested. Click
the (+) next to a device or module to view its components. Click (+) on any
component to view the tests that are available. Clicking a device, rather than
its components, selects all of the components of the device for testing.

NOTE:

After you select all the devices and components that you want to test,

highlight

All Devices and then click Run Tests.

Selecting Diagnostics Options

From the Diagnostics Options area, select the test(s) you want to run on a
device.

Non-Interactive Tests Only — Runs only tests that require no user
intervention.

Quick Tests Only — Runs only the quick tests on the device.

Show Ending Timestamp — Time stamps the test log.

Test Iterations — Selects the number of times the test is run.

Testing Option

Function

Express Test

Performs a quick check of the system. This option runs
device tests that do not require user interaction.

Extended Test

Performs a more thorough check of the system. This test
can take an hour or longer.

Custom Test

Tests a particular device.

Information

Displays test results.

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