3 testability, Testability – Avago Technologies LSI53C876E User Manual

Page 20

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1-6

General Description

•

Performs Wide Ultra SCSI synchronous transfers as fast as
40 Mbytes/s.

•

Supports 536-byte DMA FIFO for more effective PCI and SCSI bus
utilization.

•

Supports 16 levels of SCSI synchronous offset.

•

Supports variable block size and scatter/gather data transfers

•

Minimizes SCSI I/O start latency.

•

Performs complex bus sequences without interrupts, including
restore data pointers.

•

Reduces interrupt service routine overhead through a unique
interrupt status reporting method.

•

Supports Load and Store SCRIPTS instructions to increase the
performance of data transfers to and from chip registers.

•

Supports target disconnect and later reconnect with no interrupt to
the system processor.

•

Supports multithreaded I/O algorithms in SCSI SCRIPTS with fast
I/O context switching.

•

Supports expanded Register Move instructions.

•

Compatible with LSI53C875 software (drivers and SCRIPTS).

•

Enables Ultra SCSI with 40 MHz SCSI clock input with integrated
clock doubler.

1.3.3 Testability

The LSI53C876 contains these testability features:

•

All SCSI signals accessible through programmed I/O.

•

SCSI loopback diagnostics.

•

SCSI bus signal continuity checking.

•

Support for single step mode operation.

•

Test mode (AND-tree) to check pin continuity to the board.

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