Macrotestg3 - combig3, Std mode – generic test – HT instruments MACROTEST G3 User Manual

Page 35

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MACROTESTG3 - COMBIG3

EN - 34

The following table summarizes the possible measures executable depending on the type of
system (TT, TN and IT), of selected modes and the relationships that define limit values

TT

TN

IT

Mode

Condition x OK outcome

Condition x OK outcome

Condition x OK outcome

L-L

STD

No outcome

No outcome

No outcome

kA

Isc L-L max < BC

Isc L-L max < BC

Isc L-L max < BC

I

2

t

(Isc L-L 3F)

2

* t < (K * S)

2

(Isc

L-L3F)

2

* t < (K * S)

2

(Isc

L-L3F)

2

* t < (K * S)

2

(IscL-Lmin 2F) Tmax  Tmax < Tlim (IscL-L min 2F) Tmax Tmax < Tlim (IscL-Lmin 2F) Tmax  Tmax < Tlim

L-N

STD

No outcome

No outcome

No outcome

kA

Isc L-N max < BC

Isc L-N max < BC

Isc L-N max < BC

I

2

t

(Isc L-N)

2

* t < (K * S)

2

(Isc

L-N)

2

* t < (K * S)

2

(Isc

L-N)

2

* t < (K * S)

2

(Isc L-N min ) Tmax  Tmax < Tlim

(Isc L-N min ) Tmax  Tmax < Tlim (Isc L-N min ) Tmax  Tmax < Tlim

L-PE

STD

No

outcome

kA

Isc L-PE max< BC

I

2

t

(Isc

L-PE)

2

* t < (K * S)

2

(Isc L-PE min ) Tmax  Tmax < Tlim

Tlim

Ia  Isc L-PE MIN > Ia

Utmeas < Utlim

Ra

(No for
IMP57)

STD

kA

I

2

t

(Rameas * Idn) < Utlim

Isc L-PE MIN > Idn

Table 2: Conditions of positive outcome depending on the test parameters


Where:

Empty cells

Not available mode for this particular combination of electric system

Isc L-L_3F

Prospective short circuit current three-phase Phase-Phase (see § 12.5)

Isc L-L_Min2F Prospective short circuit current minimum two-phase Phase-Phase (see § 12.9)
Isc L-N_Max

Prospective short circuit current maximum Phase-Neutral (see § 12.5)

Isc L-N_Min

Prospective short circuit current minimum Phase-Neutral (see § 12.9)

Isc L-PE_Max Prospective short circuit current maximum Phase-PE (see § 12.5)
Isc L-PE_Min

Prospective short circuit current minimum Phase-PE (see § 12.9)

BC

Breaking Capacity of the protection device - kA)

K

Constant relative to the I2t measurement (vedere § 12.10)

S

Section of conductor

Tmax

Maximum trip out time of the protection device

Tlim

Limit time of fault extinction by the protection set by the user

Ut meas

Contact voltage measured

Ut lim

Contact voltage limit (25V or 50V)

Ra meas

Global earth resistance measured

Idn

Trip out current of RCD devices




6.4.2. STD Mode – Generic test

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