Sun Microsystems Sun Fire V20z - Manual (Page 47)

Chapter 3 Troubleshooting and Diagnostics 3-7
You can begin running diagnostics on the service processor while the platform
diagnostics are loading. You can use the diags get state command to determine
whether the platform diagnostics are loaded. Refer to Appendix C for more
information about this command.
3.4.3 Listing Available Diagnostics Tests and Modules
To list the available tests and modules, type the following command:
# diags get tests
Tests are available for the following modules:
■ Fans: Fan tests verify that each fan is rotating and the RPM is within the specified
ranges.
Note – The power supply fans are not testable by this diagnostic.
■ Memory: Memory tests identify memory errors, address decoding faults, and dataline
faults.
■ Network Controllers: An internal loopback test is available for NIC testing.
■ Operator Panel: The operator panel tests verify the memory of the operator panel.
The value and location of any errors are indicated.
■ Slag: Slag tests are non-interactive tests that verify the correct operation of the LED
drive circuitry.
■ Storage: Storage tests invoke a self-test on the SCSI drive.
■ Temperature: Temperature tests verify that each of the temperature sensors is
functional and that the temperature is within the specified ranges.
■ Voltage: Voltage tests are derived for power supply and bulk voltages (generated by
the VRMs associated with the CPU and memory), to determine whether the
voltage sensors are operating within their predefined limited.
TABLE 3-1 lists the diagnostics modules and tests that are associated with each
module.
TABLE 3-1 Diagnostics Modules and Tests
Module Test Devices
fan speed.fan1 CPU 1 memory fan 1
fan speed.fan2 CPU 1 memory fan 2
fan speed.fan3 CPU 1 fan 1
fan speed.fan4 CPU 1 fan 2