Yokogawa In-Situ Gas Analyzer TDLS200 - Manual (Page 12)

<2. INTRODUCTION AND GENERAL DESCRIPTION> 2-2
IM 11Y01B01-01E-A 6th Edition :Feb 13, 2013-00
Current ramp to laser
Signal at Detector
Processed Detector Signal
Current ramp to laser
Signal at Detector
Processed Detector Signal
Current ramp to laser
Signal at Detector
Processed Detector Signal
2.1.1 Measurement
• During measurement the laser is held at a fixed temperature.
This is the coarse wavelength adjustment.
• A current ramp is fed to the laser. This is the fine
wavelength adjustment. figure 1.
• The current is ramped to scan across the wavelength region desired.
• The collimated light passes through the gas to be
measured. The amount of light absorbed by the peak is
proportional to the analyte concentration.
• The light is then focused on a detector. figure 2.
• This signal is used to quantify the light absorbed by the analyte.
figure 3.
Make sure the model number on the
nameplate of the instrument agrees with your
order.
The nameplate will also contain the serial
number and any relevant certification marks.
Be sure to apply correct power to the unit, as
detailed on the nameplate.
For products used within the European
Community or other countries requiring the CE
mark and/or ATEX classification, the following
labels are attached (as appropriate):
figure 1.
figure 2.
figure 3.
2.2 Instrument Check
Upon delivery, unpack the instrument carefully and inspect it to ensure that it was not damaged during
shipment. If damage is found, retain the original packing materials (including the outer box) and then
immediately notify the carrier and the relevant Yokogawa sales office.
THIS PRODUCT COMPLIES WITH
21 CFR PART 1040.10
Made in USA
STYLE
SUPPLY --- 24.0 VDC
MAX 120W
AMB TEMP -20 TO 50
NO.
SUFFIX
TDLS200
TDLS Analyzer
MODEL
KCC-REM-
YCA-EEN999