Quantum Data 881 - Manual (Page 402)

384 Chapter 11 CEC Interactive Troubleshooting Environment (ITE)
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6. Monitor the effects of the arbritration test using the ACA. Refer to “ To monitor the CEC
bus (channel): ” on page 492 for instructions on monitoring the commands through the
ACA.
Bit corruption tests
You can simulate the corruption of any single bit of the 8 data bits in a block by changing
their timing such that the total time is less than the minimum time (2.05 milliseconds), for
example the time of the corrupt bit can be altered to 1.75 milliseconds. You have to specify
which byte you want to corrupt and which bit within that byte that you want to corrupt.
When you specify a byte and a bit to corrupt it applies to the specified byte and bit of the
subsequent message on the CEC bus.
There are two commands that are used in tandem: 1) CEC1:CECT:BADS which takes an
argument to specify which byte of the next message will be affected, and 2)
CEC1:CECT:BADM which takes an argument to specify which bit of the specified byte will
be affected (corrupted).
To test bit corruption:
1. Enter the following commands to cause a corrupt bit.