Agilent Technologies 85225F - Manual (Page 121)

DC Subsystem Functional Verification Test B
Installation and User’s Guide 121
Performing the DC Subsystem Functional Verification Test
Complete these steps to run the self- test and verify the operation the DC
subsystem.
For Agilent 4156C subsystems:
If you encounter a problem
✔ Refer to the Agilent 4156C precision semiconductor parameter analyzer
manual titled, “If You Have a Problem” for an explanation of the error
codes. See the chapter titled, “If Errors Occur When You Perform
Self- Calibration or Diagnostics.”
✔ Refer to the troubleshooting information in the service manual for the
Agilent 4156C precision semiconductor parameter analyzer.
To perform the Agilent 4156C precision semiconductor parameter analyzer self-test
Step Notes
1 Disconnect all cables from the
measurement terminals on the
4156C rear panel.
2 Connect the 4156C to line power.
3 Switch on the instrument line
power switch.
4 Wait 1 hour before continuing to
step 5 .
5 Press System > [CALIB/DIAG]. • The analyzer displays the SYSTEM:
SELF-CALIBRATION/DIAGNOSTICS
screen.
6 Press [DIAG SELFTST ALL]. • This begins the calibration and
self-test process.
• PASS, FAIL, or DONE appear in the
STATUS column.
• If a failure occurs, an error code is
displayed in the ERROR column. See
“If you encounter a problem .”
• If no errors occur, DIAG SELF-TEST
ALL: PASS appears in the lower
left-hand corner of the display.