Agilent Technologies 85225F - Manual (Page 62)

62 Installation and User’s Guide
1 Introducing the Agilent 85225F Performance Modeling System
RF Subsystem Performance Specifications
The overall performance of a network analyzer is dependent on the
individual instruments, system configuration, user- defined operating
conditions, measurement calibration, and cables.
For a specification summary, refer to Appendix G , “Network Analyzer
Performance Specification Summary,” starting on page 141.
In any high- frequency measurement, residual errors contribute
uncertainties to the results.
DC Subsystem Specifications
Specifications for the Agilent 4156C precision semiconductor parameter
analyzer are listed in its user’s guide, chapter 7 of Volume 1, “General
Information.”
Specifications for the Agilent E5260A 8- slot high speed measurement
mainframe and Agilent E5270B 8- slot precision parametric measurement
mainframe are listed in its user’s guide, Chapter 2, “Introduction.”
Bias Network Characteristics
Table 20 , “11612V Option K11/K21 Bias Network Characteristics,” on
page 139 lists the operational characteristics of the bias networks. For
detailed information, refer to
Appendix F , “Understanding the Bias
Networks,” starting on page 137.
N O T E
When the system is configured with a probe station, microwave probes, on-wafer
calibration standards, or test fixtures, additional uncertainties are contributed to the
measurement results. Refer to the manufacturer’s documentation for information on probe
station or test fixture characteristics.