Metrohm NIRS XDS Process Analyzer – MicroBundle - Manual (Page 60)

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This screen is normally displayed, with
serial numbers for the system in use.
If this configuration is correct, click on
“OK” to proceed with tests.
10.2 Interactance Reflectance Tests
The tests in this section apply specifically to Interactance Reflectance Probes.
Do not use the same procedures on other styles of probe. See the proper
section for each style of probe used.
10.2.1 Wavelength Linearization, Interactance Reflectance
The first test to be run is Wavelength Linearization. This provides initial wavelength locations for the
sample spectrum, prior to final wavelength calibration.
Wavelength Linearization uses internal wavelength materials to determine a set of internal, arbitrary
peak positions that the instrument will use to maintain repeatability of wavelength response.
Wavelength Linearization is performed on the internal reference fiber located in the XDS Process
enclosure.