Appendix f, Levelflex m guided radar level, Appendix – Rockwell Automation 1734sc-IE4CH E+H Instruments via HART to PlantPAx User Manual User Manual

Page 109

Advertising
background image

Rockwell Automation Publication PROCES-UM002A-EN-P - July 2014

109

Appendix

F

Levelflex M Guided Radar Level

Levelflex instruments are "downward-looking" measuring systems that function
according to the ToF method (ToF = Time of Flight). The distance from the
reference point (process connection of the measuring device) to the product
surface is measured. High-frequency pulses are injected to a probe and led along
the probe. The pulses are reflected by the product surface, received by the
electronic evaluation unit and converted into level information. This method is
also known as TDR (Time Domain Reflectometry).

Topic

Page

Connect a Levelflex M Guided Level-Radar

111

Configure a Levelflex M Guided Level-Radar

113

Component

Catalog Number

Details

Levelflex M guided level-radar

FMP40-APR2CNJB21CA

Firmware revision 1.04

Advertising