Rockwell Automation 193-EDN E1Plus Overload Relays - DeviceNet Module User Manual

Page 51

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Publication 193-UM006A-EN-P – October 2005

Specifications A-3

RF Immunity
Test Level

Performance Criteria

10V/m

1①✍

Electrical Fast Transient/Burst Immunity
Test Level

Performance Criteria

2 kV (Power)
1 kV (control)
1①✍

Surge Immunity
Test Level

Performance Criteria

2 kV L-E
1 kV L-L
1①✍

Radiated Emissions

Class A

Conducted Emissions

Not tested

Performance Criteria 1 requires the DUT (device under test) not to experience degradation or loss of
performance.

Environment 2 - Heavy Industrial.

WARNING

This is a class A product. In domestic environment, this product may cause radio interference, in which case the

user may be required to take adequate measures.

DeviceNet Communications:

Baud Rate

125 k, 250 k, 500 k

Auto-Baud Rate identification

Yes

Group 2 - Master-Slave Connection Set

Yes

Polled I/O Messaging

Yes

Change of State Messaging

Yes

Cyclic Messaging

Yes

Explicit Messaging

Yes

Full Parameter Object Support

Yes

Group 4 - Off-line Node Recovery Messaging

Yes

Configuration Consistency Value

Yes

Unconnected Message Manager (UCMM)

Yes

Jam Protection:

Trip Level

150…600% FLA

Trip Delay

0.1…25.0 sec.

Inhibit

0…250 sec.

Standards

UL 508

CSA 22.2, No. 14

EN 60947-4-1

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