Table 7.3 scsi signals—sd[7:0]/, sdp/, sreq/, sack, Scsi signals—sd[7:0]/, sdp/, sreq/, sack, Input signals—clk, sclk, gnt/, idsel, rst/, testin – LSI 53C810A User Manual
Page 185
DC Characteristics
7-3
Table 7.3
SCSI Signals—SD[7:0]/, SDP/, SREQ/, SACK/
Symbol
Parameter
Min
Max
Unit
Test Conditions
V
IH
Input high voltage
2.0
V
DD
+0.5
V
–
V
IL
Input low voltage
V
SS
−
0.5
0.8
V
–
V
OH
1
1. TolerANT active negation enabled.
Output high voltage
2.5
3.5
V
2.5 mA
V
OL
Output low voltage
V
SS
0.5
V
48 mA
I
IN
Input leakage
−
10
10
µ
A
–
I
OZ
3-state leakage
−
10
10
µ
A
–
Table 7.4
SCSI Signals—SMSG, SI_O/, SC_D/, SATN/, SBSY/, SSEL/, SRST/
Symbol
Parameter
Min
Max
Unit
Test Conditions
V
IH
Input high voltage
2.0
V
DD
+0.5
V
–
V
IL
Input low voltage
V
SS
−
0.5
0.8
V
–
V
OL
Output low voltage
V
SS
0.5
V
48 mA
I
IN
Input leakage
(SRST/ only)
−
10
−
500
10
−
50
µ
A
µ
A
–
I
OZ
3-state leakage
−
10
10
µ
A
–
Table 7.5
Input Signals—CLK, SCLK, GNT/, IDSEL, RST/, TESTIN
Symbol
Parameter
Min
Max
Unit
Test Conditions
V
IH
Input high voltage
2.0
V
DD
+0.5
V
–
V
IL
Input low voltage
V
SS
−
0.5
0.8
V
–
I
IN
Input leakage
−
1.0
1.0
µ
A
–
Note: CLK, SCLK, GNT/ and IDSEL have 100
µ
A pull-ups that are enabled when TESTIN is low.
TESTIN has a 100
µ
A pull-up that is always enabled.