11 testapplication, 1 slave behavior control, 1 test control object – BECKHOFF ET9300 User Manual
Page 73: Testapplication, Slave behavior control, Test control object

Application Note ET9300
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11 TestApplication
The test application is a specific slave stack which provides most of the specified EtherCAT slave
features and also a mechanism to generate a slave behavior (also behavior which is not conform to
the standard). This may be used to check master behavior with incorrect slave behavior.
This chapter is dealing with the possible configurations. The possible (mis)behaviors are organized
within CoE objects in the index range from 0x2000 to 0x2FFD (Table 11 and Table 12).
In object 0x8000 the stack configuration is listed (SDO info need to be supported by EtherCAT
master).
A release build of the test application for the EL9800 EtherCAT Evaluation board is located in
“SSC_Vxixx/hex”. To create new test application slave files select the test application configuration in
the SSC Tool.
Table 11: Test Object
Attribute
Value
Index
0x2000 to 0x2FFD
Name
Test object
Object Code
RECORD
Max SubIndex
1-255
Table 12: Test Object Entry
Sub-
Index
Description Data Type Acces
s
PDO
Mappin
g
Description / Default value
n
(equal
for
every
test)
Control/Cou
nter
UNSIGNE
D16
RW/R
No
Control the test behavior
Bit0
enable/disable the test
0: Test disabled
1: Test enabled
Bit1 -7
Reserved for future use
Bit8-15 Counter (indicates the number
of test executions)
11.1 Slave Behavior Control
Three possibilities are available to control the slave behavior either updating the enable/disable bit of
the test object directly (Table 12: Test Object Entry), or via the Test Control object (Chapter 11.1.1) or
by updating the ESC register 0xF80:0xF83 (Chapter 11.1.2).
11.1.1 Test Control Object
The Test Control object structure (Table 13 and Table 14) is similar to the PDO mapping objects.
Every Subindex (entry) of the test control object maps an enable/disable function (Bit 0) to a physical
digital input of the slave device.
If the application is compiled for the EL9800_4 EtherCAT Evaluation Kit the control object contains 7
entries (SI1-7) which are mapped to the switches 2 to 8 (switch 1 is a global test function enable
switch). If the stack is not compiled for the EL9800 the control element contains 16 Entries which are
mapped to the GPO register (0xF10:0xF11).
Table 13: Test Control Object
Attribute
Value
Index
0x2FFF
Name
Test control object