11 testapplication, 1 slave behavior control, 1 test control object – BECKHOFF ET9300 User Manual

Page 73: Testapplication, Slave behavior control, Test control object

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Application Note ET9300

71

11 TestApplication

The test application is a specific slave stack which provides most of the specified EtherCAT slave
features and also a mechanism to generate a slave behavior (also behavior which is not conform to
the standard). This may be used to check master behavior with incorrect slave behavior.

This chapter is dealing with the possible configurations. The possible (mis)behaviors are organized
within CoE objects in the index range from 0x2000 to 0x2FFD (Table 11 and Table 12).

In object 0x8000 the stack configuration is listed (SDO info need to be supported by EtherCAT
master).

A release build of the test application for the EL9800 EtherCAT Evaluation board is located in
“SSC_Vxixx/hex”. To create new test application slave files select the test application configuration in
the SSC Tool.

Table 11: Test Object

Attribute

Value

Index

0x2000 to 0x2FFD

Name

Test object

Object Code

RECORD

Max SubIndex

1-255

Table 12: Test Object Entry

Sub-
Index

Description Data Type Acces

s

PDO
Mappin
g

Description / Default value

n
(equal
for
every
test)

Control/Cou
nter

UNSIGNE
D16

RW/R

No

Control the test behavior

Bit0

enable/disable the test
0: Test disabled
1: Test enabled

Bit1 -7

Reserved for future use

Bit8-15 Counter (indicates the number

of test executions)

11.1 Slave Behavior Control

Three possibilities are available to control the slave behavior either updating the enable/disable bit of
the test object directly (Table 12: Test Object Entry), or via the Test Control object (Chapter 11.1.1) or
by updating the ESC register 0xF80:0xF83 (Chapter 11.1.2).

11.1.1 Test Control Object

The Test Control object structure (Table 13 and Table 14) is similar to the PDO mapping objects.
Every Subindex (entry) of the test control object maps an enable/disable function (Bit 0) to a physical
digital input of the slave device.

If the application is compiled for the EL9800_4 EtherCAT Evaluation Kit the control object contains 7
entries (SI1-7) which are mapped to the switches 2 to 8 (switch 1 is a global test function enable
switch). If the stack is not compiled for the EL9800 the control element contains 16 Entries which are
mapped to the GPO register (0xF10:0xF11).

Table 13: Test Control Object

Attribute

Value

Index

0x2FFF

Name

Test control object

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