23 external interface read timing, Figure 6-29. example read access – Texas Instruments Digital Signal Processor SM320F2812-HT User Manual

Page 119

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Lead

Active

Trail

DIN

t

d(XCOHL-XRDL)

t

d(XCOH-XA)

t

d(XCOH-XZCSL)

t

d(XCOHL-XRDH)

t

h(XD)XRD

t

d(XCOHL-XZCSH)

XCLKOUT=XTIMCLK

XCLKOUT= 1/2 XTIMCLK

XZCS0AND1, XZCS2,

XZCS6AND7

XA[0:18]

XRD

XWE

XR/W

XD[0:15]

NOTES: A. All XINTF accesses (lead period) begin on the rising edge of XCLKOUT. When necessary, the device inserts an

alignment cycle before an access to meet this requirement.

B. During alignment cycles, all signals transitions to their inactive state.

C. For USEREADY = 0, the external XREADY input signal is ignored.
D. XA[0:18] holds the last address put on the bus during inactive cycles, including alignment cycles.

t

su(XD)XRD

t

a(A)

t

a(XRD)

XREADY

SM320F2812-HT

www.ti.com

SGUS062B

JUNE 2009

REVISED JUNE 2011

6.23 External Interface Read Timing

Table 6-34. External Memory Interface Read Switching Characteristics

(1)

PARAMETER

MIN

MAX

UNIT

t

d(XCOH-XZCSL)

Delay time, XCLKOUT high to zone chip-select active low

1

ns

t

d(XCOHL-XZCSH)

Delay time, XCLKOUT high/low to zone chip-select inactive high

2

3

ns

t

d(XCOH-XA)

Delay time, XCLKOUT high to address valid

2

ns

t

d(XCOHL-XRDL)

Delay time, XCLKOUT high/low to XRD active low

1

ns

t

d(XCOHL-XRDH

Delay time, XCLKOUT high/low to XRD inactive high

2

1

ns

t

h(XA)XZCSH

Hold time, address valid after zone chip-select inactive high

(2)

ns

t

h(XA)XRD

Hold time, address valid after XRD inactive high

(2)

ns

(1)

Not production tested.

(2)

During inactive cycles, the XINTF address bus always holds the last address put out on the bus. This includes alignment cycles.

Table 6-35. External Memory Interface Read Timing Requirements

(1)

MIN

MAX

UNIT

t

a(A)

Access time, read data from address valid

(LR + AR)

14

(2)

ns

t

a(XRD)

Access time, read data valid from XRD active low

AR

12

(2)

ns

t

su(XD)XRD

Setup time, read data valid before XRD strobe inactive high

12

ns

t

h(XD)XRD

Hold time, read data valid after XRD inactive high

0

ns

(1)

Not production tested.

(2)

LR = Lead period, read access. AR = Active period, read access. See

Table 6-25

.

Figure 6-29. Example Read Access

Copyright

©

2009

2011, Texas Instruments Incorporated

Electrical Specifications

119

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