Texas Instruments Digital Signal Processor SM320F2812-HT User Manual
Page 19
SGUS062B
–
JUNE 2009
–
REVISED JUNE 2011
Table 2-3. Signal Descriptions
(continued)
PIN NO.
DIE PAD
DIE PAD
DIE PAD
NAME
X-CENTER
Y-CENTER
I/O/Z
(2)
PU/PD
(3)
DESCRIPTION
172-PIN
NO.
(
μ
m)
(
μ
m)
HFG
JTAG test reset with internal pulldown.
TRST, when driven high, gives the scan
system control of the operations of the
device. If this signal is not connected or
driven low, the device operates in its
functional mode, and the test reset signals
are ignored.
NOTE: Do not use pullup resistors on
TRST; it has an internal pulldown device. In
a low-noise environment, TRST can be left
TRST
132
148
42.6
4684.8
I
PD
floating. In a high-noise environment, an
additional pulldown resistor may be
needed. The value of this resistor should be
based on drive strength of the debugger
pods applicable to the design. A 2.2-k
Ω
resistor generally offers adequate
protection. Since this is application specific,
it is recommended that each target board is
validated for proper operation of the
debugger and the application.
TCK
133
149
42.6
4605.1
I
PU
JTAG test clock with internal pullup
JTAG test-mode select (TMS) with internal
pullup. This serial control input is clocked
TMS
123
139
872.5
5057.5
I
PU
into the TAP controller on the rising edge of
TCK.
JTAG test data input (TDI) with internal
pullup. TDI is clocked into the selected
TDI
128
144
350.4
5057.5
I
PU
register (instruction or data) on a rising
edge of TCK.
JTAG scan out, test data output (TDO). The
contents of the selected register (instruction
TDO
124
140
777.9
5057.5
O/Z
–
or data) is shifted out of TDO on the falling
edge of TCK.
Emulator pin 0. When TRST is driven high,
this pin is used as an interrupt to or from
EMU0
133
150
42.6
4525.3
I/O/Z
PU
the emulator system and is defined as
input/output through the JTAG scan.
Emulator pin 1. When TRST is driven high,
this pin is used as an interrupt to or from
EMU1
143
161
42.6
3430.9
I/O/Z
PU
the emulator system and is defined as
input/output through the JTAG scan.
Copyright
©
2009
–
2011, Texas Instruments Incorporated
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