INFICON SQM-160 Thin Film Deposition Monitor - Manual (Page 112)

A - 2
IP
N 07
4-
51
1-
P1
C
SQM-160 Operating Manual
BaN
2
O
6
3.244 1.261 Barium Nitrate
BaO 5.720 *1.000 Barium Oxide
BaTiO
3
5.999 0.464 Barium Titanate (Tetr)
BaTiO
3
6.035 0.412 Barium Titanate (Cubic)
Be 1.850 0.543 Beryllium
BeF
2
1.990 *1.000 Beryllium Fluoride
BeO 3.010 *1.000 Beryllium Oxide
Bi 9.800 0.790 Bismuth
Bi
2
O
3
8.900 *1.000 Bismuth Oxide
Bi
2
S
3
7.390 *1.000 Bismuth Trisulphide
Bi
2
Se
3
6.820 *1.000 Bismuth Selenide
Bi
2
Te
3
7.700 *1.000 Bismuth Telluride
BiF
3
5.320 *1.000 Bismuth Fluoride
C 2.250 3.260 Carbon (Graphite)
C 3.520 0.220 Carbon (Diamond)
C
8
H
8
1.100 *1.000 Parlyene (Union Carbide)
Ca 1.550 2.620 Calcium
CaF
2
3.180 0.775 Calcium Fluoride
CaO 3.350 *1.000 Calcium Oxide
CaO-SiO
2
2.900 *1.000 Calcium Silicate (3)
CaSO
4
2.962 0.955 Calcium Sulfate
CaTiO
3
4.100 *1.000 Calcium Titanate
CaWO
4
6.060 *1.000 Calcium Tungstate
Cd 8.640 0.682 Cadmium
CdF
2
6.640 *1.000 Cadmium Fluoride
CdO 8.150 *1.000 Cadmium Oxide
CdS 4.830 1.020 Cadmium Sulfide
CdSe 5.810 *1.000 Cadmium Selenide
CdTe 6.200 0.980 Cadmium Telluride
Ce 6.780 *1.000 Cerium
CeF
3
6.160 *1.000 Cerium (III) Fluoride
CeO
2
7.130 *1.000 Cerium (IV) Dioxide
Co 8.900 0.343 Cobalt
Table A-1 Material Table (continued)
Formula Density Z-Ratio Material Name