HT instruments SIRIUS89N - Manual (Page 38)

SIRIUS89N
EN - 36
RCD 05.06.01
RCD tripping time is bigger
than the maximum
measurable time (it
depends on type of test,
see following table).
o >999
ms
FRQ=50.0Hz Ut= 1V
VP-N=231V VP-PE= 230V
o
TIME NOT OK
x1 30mA 50V
!
FUNC IdN RCD UL
ATTENTION: the tripping
time is higher than the
standard limit.
If the RCD tripping time
is higher than the
instrument’s measuring
limits, the instrument
emits
a long sound
signal at the end of the
test and displays the
values alongside.
The maximum duration depends on the test type:
Test type General RCD Selective RCD
MAN x1 test 999ms 999ms
MAN x2 test 200ms 250ms
MAN x5 test 50ms 160ms
" " test 300ms
RCD 05.06.01 Tripping Current.
27
mA
>300ms
Freq=50.0Hz Ut= 1V
VP-N=231V Vp-PE=230V
o TIME NOT OK
30mA 50V
!
FUNC IdN RCD UL
Tripping Time exceeding
limit value
During the ramp test
if the RCD tripping time
is higher than the limit,
the instrument emits
a
long sound signal at
the end of the test and
displays the values
alongside.
RCD 05.06.01
Maximum current
generated by the
instrument during the test
for general RCDs (the
value indicated is referred
to an AC type 30mA RCD,
in this case the maximum
current supplied is equal to
1.4xI
∆N
o > 42
mA
>300ms
FRQ=50.0Hz Ut= 1V
VP-N=231V VP-PE=230V
o CURRENT NOT OK
30mA 50V
!
FUNC IdN RCD UL
During the ramp test
if the RCD tripping
current is higher than I
∆n
(Type AC) or 1.4 I ∆n
(Type A with I ∆n >10mA)
or 2 I ∆n (Type A with
I
∆n
≤10mA) , the
instrument emits a long
sound signal at the end
of the test and displays
the values alongside.
ATTENTION:
the RCD tripping current is
higher than the Nominal
Value (I ∆N =30mA was set
in the example ).
The previous results can be stored pressing the SAVE key twice (according to
paragraph 9.1).