Configure the test output tab – Rockwell Automation 1791DS-IBxxxx Guard I/O DeviceNet Safety Modules User Manual

Page 76

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Rockwell Automation Publication 1791DS-UM001J-EN-P - May 2013

Chapter 5

Configure Modules with the Logix Designer Application

6.

Assign the Input Delay Time, On -> Off (0…126 ms, in increments of
6 ms).

Filter time is ON to OFF transition. Input must be LO after input delay
has elapsed before it is set logic 0. This delay time is configured per channel
with each channel specifically tuned to match the characteristics of the
field device, for maximum performance.

7.

From the Input Error Latch Time box, enter the time the module holds an
error to make sure the controller can detect it (0…65,530 ms, in increments
of 10 ms - default 1000 ms).

This provides you more reliable diagnostics and enhances the chances that
a nuisance error is detected. The purpose for latching input errors is to
make sure that intermittent faults that may only exist for a few
milliseconds are latched long enough to be read by the controller. The
amount of time to latch the errors should be based on the RPI, the safety
task watchdog, and other application-specific variables.

8.

Click OK.

Configure the
Test Output Tab

This section describes how to work with the Test Output Configuration dialog
box. Refer to this table for information on configuring test outputs.

Follow this procedure to complete the test output configuration.

1.

From the Module Properties dialog box, click the Test Output tab.

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