Rockwell Automation 1791DS-IBxxxx Guard I/O DeviceNet Safety Modules - Manual (Page 88)

88 Rockwell Automation Publication 1791DS-UM001J-EN-P - May 2013
Chapter 6 Configure Modules in RSNetWorx for DeviceNet Software
3. Assign the Mode.
4. Assign the Test Source for each safety input on the module you want pulse
tested.
5. Assign the Input Delay Time, Off -> On (0…126 ms, in increments of
6 ms).
Filter time is for OFF to ON transition. Input must be HI after input delay
has elapsed before it is set logic 1. This delay time is configured per channel
with each channel specifically tuned to match the characteristics of the
field device, for maximum performance.
Choose Description
Not Used The input is disabled. It remains logic 0 if 24V is applied to the input terminal.
Safety Pulse Test Pulse testing is performed on this input circuit. A test source on the Guard I/o
module must be used as the 24V source for this circuit. The test source is
configured by using the test source pull-down menu. The pulse test will detect
shorts to 24V and channel-to-channel shorts to other inputs.
Safety A safety input is connected but there is no requirement for the Guard I/O module to
perform a pulse test on this circuit. An example is a safety device that performs its
own pulse tests on the input wires, such as a light curtain.
Standard A standard device, such as a reset switch, is connected. This point cannot be used in
dual-channel operation.
Choose Description
None If pulse testing is being performed on an input point, then the test
source that is sourcing the 24V for the input circuit must be selected.
If the incorrect test source is entered, the result is pulse test failures
on that input circuit.
0
1
2
3
4…15
(1)
(1) The number of test outputs varies per catalog number.