De-energize-to-trip 2-year proof test interval – Rockwell Automation 1715-OF8I Redundant I/O System User Manual User Manual
Page 299

Rockwell Automation Publication 1715-UM001C-EN-P - March 2014
299
PFD and PFH Calculations for a SIL 2 System
Appendix E
The PFD calculations in
are calculated for a 2-year proof test interval
(17,520 hours) and are specific to1715 I/O components in ControlLogix
systems.
De-energize-to-trip 2-year Proof Test Interval
Table 72 - De-energize-to-trip 2-year Proof Test Interval
MTTR 24 Hours
PTI 2.0 Years
Simplex Configuration
Duplex Configuration
Ca
t N
o.
Se
rie
s
Fi
rm
wa
re
Ve
rs
io
n
De
scr
ip
tio
n
MT
BF
λs
λdu
λdd
SF
F
tce
'
HFT
PFH
de
PFDde
ST
R
β
βd
tce
'
tge'
HFT
PFH
de
PFDde
Arch
ST
R
1715-
AENTR
A
2.001 EtherNet
adapter
dual
module
84
1,973
8.43
E-
07
9.82
E-
09
3.34
E-
07
97
.74%
N/A
N/A
N/A
N/A
N/A
1.0
%
1.0
%
2.32
E+
02
1.63
E+
02
1
3.46
E-
09
9.44
E-
07
1oo2
D
8.43
E-
08
1715-
IB16D
A
2.001 16-
channel
digital
input
module
3,53
5,791
2.06
E-07
6.57
E-10
7.60
E-08
99.7
7%
9.91
E+01
0
7.48
E-10
8.39
E-06
2.82
E-07
1.0%
0.5%
4.45
E+01
3.77
E+01
1
4.77
E-10
8.60
E-07
1oo2D
2.06
E-09
1715-
IF16
A
2.001 16-
channel
analog
input
module
3,535,7
91
2.06E-
07
6.57E-
10
7.60E-
08
99
.77%
9.91E+
01
0
7.48E-
10
8.39E-
06
2.82E-
07
1.0
%
0.5
%
4.45E+
01
3.77E+
01
1
4.77E-
10
8.60E-
07
1oo2D
2.06E-
09
1715-
OB8DE
A
2.001 16-
channel
digital
output
module
9,67
7,08
5
7.94
E-08
2.96
E-10
2.36
E-08
99
.26%
1.32
E+0
2
1
7.67
E-10
3.13
E-06
1.03
E-07
1.0%
1.0%
N/A
N/A
1
1.53
E-09
6.25
E-06
2oo2
7.94
E-10
1715-
OF8I
A
2.001 16-
channel
analog
output
module
5,446
,179
1.34E
-07
5.50E
-10
4.96E
-08
99.51
%
1.20E
+02
1
8.96E
-10
6.02E
-06
1.83E
-07
1.0%
0.5%
N/A
N/A
1
1.79E
-09
1.20E
-05
2oo2
1.34E
-09