5 burnout, Procedure – Yokogawa PC-Based MX100 User Manual

Page 41

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2-12

SM MX100-01E

Measurement Interval of 50 ms

Measuring Range

Input Value

Specification

20 mV

+20.000 mV
0.000 mV
-20.000 mV

±(0.05% of rdg + 5 digits)

60 mV

+60.00 mV
0.00 mV
-60.00 V

±(0.05% of rdg + 2 digits)

200 mV

+200.00 mV
0.00 mV
-200.00 mV

±(0.05% of rdg + 2 digits)

2 V

+2.0000 V
0.00 mV
-2.0000 V

±(0.05% of rdg + 5 digits)

6 V

+6.000 V
0.00 mV
-6.000 V

±(0.05% of rdg + 2 digits)

20 V

+20.000 V
0.000 V
-20.000 V

±(0.05% of rdg + 2 digits)

100 V

+100.00 V
0.000 V
-100.00 V

±(0.05% of rdg + 2 digits)

Pt100/1 mA
High resolution

43.88 Ω/-140.00°C
100.00 Ω/0.00°C
157.33 Ω/+150.00°C

±(0.05% of rdg + 0.3°C)

Pt100/1 mA

18.52 Ω/-200.0°C
100.00 Ω/0.0°C
313.71 Ω/+600.0°C

±(0.05% of rdg + 0.3°C)

Cu10
G.E. high resolution/2 mA

1.326 Ω/-200.0°C
9.036 Ω/0.0°C
20.601 Ω/+300°C

±(0.1% of rdg + 0.7°C)

Cu10G.E./2 mA

9.036 Ω/0.0°C

±(0.1% of rdg + 0.7°C)

J263B /2 mA

109.408 Ω/300K

±(0.05% of rdg + 0.3 K)

Pt100 high stability /2 mA

18.52 Ω/-200.0°C
10.00 Ω/0.0°C
194.10 Ω/+250.0°C

±(0.05% of rdg + 0.3°C)

2.4.5

Burnout

For this test, the Four-Channel, High-Speed Universal Input Module is installed with the
MX100, MW100, or equivalent device.

Test Conditions

• Set Burnout to UP or DOWN, and ready the instrument for measurement before

performing the test.

• If Burnout is set to OFF, perform the test at 1 M

.

Procedure

1.

Connect the resistances below between A and B (1-2) on channels 1 through 3,

then confirm that the criteria are met.

Resistance

Measuring Range

Criteria

22 kΩ

Type-K

That the measured value does not max out

1 MΩ

Type-K

That an overrange or burnout is detected

The MX110-UNV-H04 has a separate AD for each channel, so the burnout
operation on each channel (1 through 4) must be confirmed.

Do this when burnout is set to both UP and DOWN.

2.

After confirmation of the burnout operation, turn the burnout setting OFF.

3.

Confirm that the measured values do not max out when the above resistances are

connected.

2.4 Tests of the 4-CH, High-Speed Universal Input Module (MX110-UNV-H04)

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