Samsung S3F401F - Manual (Page 275)

S3F401F_UM_REV1.00 ELECTRICAL DATA
13-5
Table 13-7. 12-bit ADC Electrical Characteristics
(T
A
= −40°C to + 85°C, V
DD
= 3.3
± 0.3V)
Parameter Symbol Min Typ Max Unit
Resolution
−
12 12 12 Bit
ADC Reference Voltage AV
DD
3.0 3.3 3.6 V
Analog Input Voltage AV
IN
AV
SS
– AV
DD
V
Maximum Conversion Rate F
ADC
– – 4 MHz
Conversion Time T
ADC
9+ N (NOTE1) – – 1/F
ADC
Differential Linearity Error ( F
ADC =
1MHz) DNE (NOTE2) –
±0.7 ±1.0
LSB (NOTE3)
Integral Linearity Error (F
ADC =
1MHz) INE (NOTE2) –
±1.8 ± .2
Top Offset Voltage Error (AV
DD
=3.3V) EOT – 40 80 mV
Bottom Offset Voltage Error
(AV
DD
= 3.3V)
EOB – 40 80
NOTES:
1. N= 0, 1, or 2
Conversion time is different from depending on the ADC mode in conversion.
ADC Sampling Mode ADCCON Register Min Typ Max Unit
1-point sampling ADCCON.9
−.8 = 01b
9
− −
2-point simultaneous sampling ADCCON.9
−.8 = 10b
10
− −
3-point simultaneous sampling ADCCON.9
−.8 = 00b
11
− −
1/F
ADC
ADC Sampling Mode ADCCON Register Min Typ Max Unit
1-point sampling ADCCON.9
−.8 = 01b
2.25
− −
2-point simultaneous sampling ADCCON.9
−.8 = 10b
2.5
− −
3-point simultaneous sampling ADCCON.9
−.8 = 00b
2.75
− −
us
2. DLE and ILE have the same amount of information because ILE is the linear function of DLE in original.
In normal test, histogram method is used because of uncertainty. Histogram method counts the occurrence of each digital
code in digital domain, instead of measuring each segment width in analog domain. DLE and ILE provide a measure of
linearity (regularity, consistency) of ADC.
3. LSB: Least Significant Bit