Agilent Technologies Agilent E5250A - Manual (Page 282)

9-26 Agilent E5250A User’s Guide, Edition 11
Executing Sample Programs
HCI Measurement Program
Figure 9-4 DC HCI Degradation Test Equipment Connections
NOTE Device used to Determine Stress Conditions
HCI test program (SP_MUX_M) uses Device1 above to determine stress voltages
(Vdstr and Vgstr). So, during the program, you are prompted to replace Device1
after these voltages are determined.
GPIB Cable
GNDU
BIAS SOURCE 1
HP BASIC
CONTROLLER
E5250A
SLOT1
Bias Input
Shielding Box
Source
Drain
Gate Sub
Device1 Device24
(Total 24ea.)
Output
1--24
25--48
49--72
1
25
49
GNDU
Device2
1
GNDU
72
24
24
48
72
to
to
to
48 26
50 49
25
2
BIAS SOURCE 3
BIAS SOURCE 2
SMU
16494D-001 or 002 ( 9 ea.)
16494A-001 or 002
16495D
BNC Cable (3ea.)
16494A-003 (3ea.)
SLOT2
Bias Input
SLOT3
Bias Input
4155/4156
41501